Transmission Electron Microscopy: A Textbook for Materials Science David B. Williams is a renewed and expanded text on transmission electron microscopy. This study book is intended for students and professionals in materials science who are seeking practical and theoretical knowledge about this analysis technique.
This new edition, published by Springer-Verlag New York Inc., features four-color illustrations and a generous collection of self-test questions, making it a comprehensive reference work for materials science. The book has been thoroughly revised and updated after twelve years, with more than 800 self-assessment questions and over 400 homework questions.
Product information
- Author: David B. Williams
- Publisher: Springer-Verlag New York Inc.
- Publication date: 2009-08-05
- Number of pages: 775
- ISBN: 9780387765020
- Subject: Microscopy
- BISAC: SCIENCE / Microscopes & Microscopy
This study book for materials science emphasizes the practical application of transmission electron microscopy with clear instructions and examples. By combining scientific accuracy with educational support, this new edition becomes an indispensable tool in the field.