Statistical Pattern Recognition is a textbook by Andrew R. Webb, published by John Wiley & Sons Inc. This accessible reference work covers statistical patterns and techniques for pattern recognition, with applications including biometrics, security, finance, and condition monitoring.
Description
This book introduces statistical methods for analyzing data and making well-informed decisions. The content is drawn from various disciplines such as engineering, statistics, computer science, and the social sciences. Examples include Bayesian methods, neural networks, support vector machines, and techniques for feature selection and reduction.
The third edition includes new topics, including analysis of complex networks and contemporary applications. Technical descriptions are supported with practical examples and exercises, including extensive computer projects. This makes the book suitable for advanced students and professionals in statistics, computer science, and engineering.
Product features
- Author: Andrew R. Webb (QinetiQ Ltd)
- Publisher: John Wiley & Sons Inc
- Publication date: 2011-10-21
- Number of pages: 672
- ISBN: 9780470682289
- Subject: Probability and statistics
- BISAC: MATHEMATICS / Probability & Statistics / General
About the author
Dr Andrew Robert Webb, Senior Researcher at QinetiQ Ltd, Malvern, UK.
Dr Keith Derek Copsey, Senior Researcher at QinetiQ Ltd, Malvern, UK.