Microstructural Characterization of Materials, 2nd Edition David Brandon provides a thorough introduction to microstructural characterization. This study book covers the use of various probes to investigate carefully prepared materials. This 2nd edition is intended for students and professionals in materials science and engineering who want to deepen their understanding of experimental analysis methods.
Contents
Microstructural characterization is achieved by applying a probe that interacts with a specimen. The main probes are visible light, X-rays, high-energy particles, and fine scans. These form the basis of optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. The expanded edition covers crystal structure, microstructural morphology, and microanalysis. New chapters address surface probe microscopy, digital image processing, orientation imaging, focused ion beams, atom probe, and 3D reconstruction.
Product specifications
- Author: David Brandon (Technion - Israel Institute of Technology)
- Publisher: John Wiley & Sons Inc
- Publication date: 2008-03-14
- Number of pages: 560
- ISBN: 9780470027851
- Subject: Materials science
- BISAC: TECHNOLOGY & ENGINEERING / Materials Science / General
Author
David Brandon, associated with the Israel Institute of Technology in Haifa, is a specialist in microstructural characterization and the author of this standard work, published by Wiley.