Fundamentals of Nanoscale Film Analysis van Terry L. Alford biedt een diepgaande studie van technieken om de structuur, samenstelling en dieptedistributie van materialen te kwantificeren met behulp van energetische deeltjes en fotonen. Dit studieboek is bedoeld voor professionals en studenten in de nanotechnologie en materialenwetenschappen.
The book describes characterization techniques focused on nanoscale structures and on the interactions between incoming particles or photons and materials. These interactions result in the emission of particles and photons whose energy and intensity are decisive for material analysis.
Contents
In addition to the theoretical foundation, the reference work covers various techniques such as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, and nuclear reactions. It also discusses analytical methods and scanning probe microscopy in detail.
Product specifications
- Author: Terry L. Alford
- Publisher: Springer-Verlag New York Inc.
- Publication date: 2007-02-16
- Number of pages: 336
- ISBN: 9780387292601
- Topic: Nanotechnology
- BISAC: TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS