Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits M. Bushnell and Vishwani Agrawal are an English-language textbook aimed at electronic testing in digital, memory, and mixed-signal VLSI systems. This book provides a thorough foundation for a course on electronic testing and is suitable for students and professionals in technical education.
This textbook covers the fundamental concepts and methods for testing digital circuits and VLSI applications. It addresses both theoretical and practical aspects and is therefore a valuable reference for courses in which electronic testing is central. Due to its extensive content, an instructor can select specific topics that align with particular learning objectives and areas of expertise.
The content closely aligns with fields such as electronic materials, devices, computer science, and engineering science. The book is part of the Frontiers in Electronic Testing series and provides the first complete coverage of electronic testing for digital, memory, and mixed-signal subsystems.