A Textbook for Materials Science
This market-leading text has been fully updated and expanded in the first new edition for 12 years. Now with four-color illustrations and hundreds of new self-assessment questions, the text is a one-stop shop on this materials characterization technique.
Omschrijving
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition.
Praise for the first edition:
`The best textbook for this audience available.' - American Scientist
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' - Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' - Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' - MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' - from the Foreword by Professor Gareth Thomas, University ofCalifornia, Berkeley
Productspecificaties
- Auteur: David B. Williams
- Uitgever: Springer-Verlag New York Inc.
- Verschijningsdatum: 2009-08-05
- Aantal pagina's: 775
- ISBN: 9780387765020
- Thema: Microscopy
- BISAC: SCIENCE / Microscopes & Microscopy